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Seica China espone il sistema V8 e il Compact DT - Booth 4F01 - 11-13 Maggio

Seica to Exhibit at Nepcon Shanghai Show

Seica's innovative test and assembly solutions are being used across the globe to improve quality, increase productivity and save money in automobile, military and consumer markets. At Nepcon Shanghai Booth Hall 1, booth 4F01 the company will showcase the following products and solutions:

The Compact Line reaps the benefits of the legacy and success of Seica’s preceding lines of in-circuit and functional testers, adding special attention to the needs of today’s electronic board production environments.

The Compact DT system is an interesting functional test solution, equipped with analog, digital and boundary scan measurement capabilities, all integrated in a very small enclosure characterized by high portability and readiness for rack-style assembly in more complex systems.

Pilot V8 Flying Prober

The Pilot V8 represents the latest frontier in flying probe test technology and is the complete solution for those who want maximum performance: the highest test speed, test coverage and flexibility, whether they are testing prototypes, manufacturing lots, or repairing any type of board. With 8 electrical flying probes, 2 Openfix flying probes, 2 power flying probes, 2 CCD cameras, and 2 thermal probes, the Pilot V8 has up to 16 mobile resources available to test the UUT, all included in a vertical, very compact and robust architecture, making the Pilot V8 unique in its genre. Its multiple flying probes can also execute parallel test on two UUTs at the same time, effectively doubling test capacity with respect to a 4-probe system. The mobile power probes represent another important innovation, which enables the power-up of the UUT  functional test  without requiring any additional, fixed cables.